周俊国, 张炎. 南瓜幼苗对低温胁迫适应性的研究[J]. 中国生态农业学报(中英文), 2007, 15(2): 111-113.
引用本文: 周俊国, 张炎. 南瓜幼苗对低温胁迫适应性的研究[J]. 中国生态农业学报(中英文), 2007, 15(2): 111-113.
ZHOU Jun-Guo, ZHANG Yan. Adaptability of Cucurbita moschata Duch. seedlings to low-temperature stress[J]. Chinese Journal of Eco-Agriculture, 2007, 15(2): 111-113.
Citation: ZHOU Jun-Guo, ZHANG Yan. Adaptability of Cucurbita moschata Duch. seedlings to low-temperature stress[J]. Chinese Journal of Eco-Agriculture, 2007, 15(2): 111-113.

南瓜幼苗对低温胁迫适应性的研究

Adaptability of Cucurbita moschata Duch. seedlings to low-temperature stress

  • 摘要: 对3片真叶南瓜幼苗进行24h的25/ 15℃、15/ 10℃、10/ 5℃、5/ 0℃暗处理,用电导法测定其电导率。试验结果表明:处理材料渗透60min时所测得的电导率具有代表性,在5/ 0℃温度处理水平上测得的电导率能显著区分不同材料间适应低温胁迫的强弱,5/ 0℃可作为南瓜幼苗生长的极端低温,南瓜幼苗有适应低温胁迫的能力,但不同材料间具有一定差异,供试材料“344”、“360”、“151”表现出对低温胁迫的适应性,可作为抗寒资源加以利用。

     

    Abstract: Seedlings of Cucurbita moschata Duch. with three true leaves were put in the darkness under low-temperature of 25/15℃(day/night),15/10℃,10/5℃,5/0℃ for 24 hour;and the electric conductivities of treated seedlings were measured to study the adaptability of the Cucurbita moschata Duch. to low temperature stress.The results show that the electric conductivity measured after the leaves are leaked for 60 minutes is typical.And the electric conductivity of leaves under 5/0℃ treatment can be used to distinguish the adaptabilities of different materials,indicating that 5/0℃ is the lowest growing temperature of Cucurbita moschata Duch.The adaptability varies among different varieties,and materials No 344,360,151 can be applied in the future.

     

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